The applied deconvolution strategy may provide a simple guideline to obtaining high-quality fits to experimental data on the basis of a careful evaluation of experimental conditions, sample properties, and the limits of the fit procedure. The sp2 peak, characteristic of aromatic carbon, features a strong asymmetry that changes with the curvature of the sample surface and, thus, cannot be neglected in spectral analysis. Aluminium oxide is an insulating material and the oxide peak position may vary with the thickness of the film. In the presence of high platinum or copper concentrations, acquire Al2s as well as (or instead of) Al2p peak. These findings illustrate that both spectral line shapes and binding energy components must be considered in the analysis of potentially defective surfaces of carbon materials. Silicate and alumina referenced to adventitious C1s peak at 284.8eV. With high-resolution XPS and XPS depth profiling, the spectral components arising from disordered carbon and surface-defect states can be distinguished from aromatic sp2 carbon. Controlled manipulation of such samples is performed by annealing, sputtering, and oxygen functionalization to identify different CC bonding states and assess the impact of the manipulations on spectral line shapes and their binding energy positions. inh dl g 0.44 0.64 PPG-PU PTMG-PU a) Inherent viscosity at 30 C in N,N. a) Calculated from the chain repeating structure. In this work, an overview of extrinsic and intrinsic effects that influence the C 1s XPS spectra-for example, photon broadening or carbon–catalyst interaction-of various graphitic samples is presented. (1) XPS peak position (in eV) and (2) percentage (in atom-) from high-resolution C(1s) spectra (air-facing surface) (3) bulk fraction (in atom-)a) PPG-PU PTMG-PU (1) 284.6 (2) 51.1 (3) 56.7 (1) 284.6 (2) 66.0 (3) 66.0 a) Calculated from the chain repeating structure. However, the analysis of XPS data-in particular the C 1s region-can be complex, impeding a straightforward evaluation of the data. X-ray photoelectron spectroscopy (XPS) is a widely used technique for characterizing the chemical and electronic properties of highly ordered carbon nanostructures, such as carbon nanotubes and graphene.
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